Title :
A fully-integrated +23-dBm CMOS triple cascode linear power amplifier with inner-parallel power control scheme
Author :
Oh, Hyoung-Seok ; Kim, Cheon-Soo ; Yu, Hyun-Kyu ; Kim, Choong-ki
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon
Abstract :
The low oxide breakdown voltage of CMOS power transistor and low power-added efficiency (PAE) at low power levels have been major challenging issues in the implementation of high-power linear power amplifiers (PAs), especially in deep sub-micron CMOS technology. In order to alleviate these problems, a triple cascode CMOS PA with inner-parallel power control scheme is presented. The proposed PA, fully-integrated in 0.18mum CMOS technology, delivers an output power of 23dBm with 35% PAE at 3.3V supply voltage. Since the thin-oxide transistors of the minimum feature size can be utilized as power transistors in the proposed PA, a high power gain of 19dB has been achieved even at single-stage. And PAE at an 8dB-backoff from the 1dB compression point (P1dB) of 20dBm has been measured as high as 12%
Keywords :
CMOS analogue integrated circuits; low-power electronics; power amplifiers; 0.18 micron; 19 dB; 3.3 V; CMOS power transistor; CMOS triple cascode linear power amplifier; deep sub-micron CMOS technology; inner-parallel power control scheme; oxide breakdown voltage; power-added efficiency; thin-oxide transistors; Breakdown voltage; CMOS technology; Complexity theory; Degradation; High power amplifiers; Linearity; Power amplifiers; Power control; Power generation; Radiofrequency amplifiers;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-9572-7
DOI :
10.1109/RFIC.2006.1651111