Title : 
Matrix determination for in vivo tissue characterization by parametric electrical impedance imaging
         
        
            Author : 
Morucci, Jean-Pierre ; Ayeva, Bachir ; Fargues, Francois ; Rigaud, Bernard
         
        
            Author_Institution : 
Inst. Nat. de la Sante et de la Recherche Med., Toulouse, France
         
        
        
        
            fDate : 
31 Oct-3 Nov 1996
         
        
        
            Abstract : 
A method is proposed by which bioelectric impedance spectrometry is combined with bioelectric impedance imaging to provide noninvasive characterization of tissue. Multifrequency measurements are performed on a numerical phantom (a mesh of 208 square pixels, each side of the square being replaced by a RSC circuit to simulate tissue impedance). An impedance perturbation (characterized by a change in the characteristic frequency) placed on the circuit can be reconstructed thanks to a direct sensitivity matrix (DSM) determined by simulation and specially built for the numerical phantom. The reconstructed information in the pixel of the characteristic frequency and image of perturbations is shown
         
        
            Keywords : 
electric impedance imaging; image reconstruction; medical image processing; sensitivity analysis; bioelectric impedance spectrometry; characteristic frequency; direct sensitivity matrix; image of perturbations; impedance perturbation; in vivo tissue characterization; matrix determination; multifrequency measurements; noninvasive characterization; numerical phantom; parametric electrical impedance imaging; simulation; Bioelectric phenomena; Circuit simulation; Electrochemical impedance spectroscopy; Frequency; Image reconstruction; Imaging phantoms; Impedance measurement; In vivo; Performance evaluation; Pixel;
         
        
        
        
            Conference_Titel : 
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
         
        
            Conference_Location : 
Amsterdam
         
        
            Print_ISBN : 
0-7803-3811-1
         
        
        
            DOI : 
10.1109/IEMBS.1996.651979