• DocumentCode
    2209704
  • Title

    Reliability stress test method: impact on the new product introduction process, time to market, field reliability impact and reliability assessment

  • Author

    Jawaid, S. ; Ferguson, Jon ; Zaki, Seifi

  • Author_Institution
    BigBear Networks, Milpitas, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    332
  • Lastpage
    337
  • Abstract
    A comprehensive reliability stress test program is not a trivial undertaking. The shake and bake approach without a complete understanding of the failure modes and mechanisms, the design and technology limitations and potential, and the reliability objectives may buy a few short term gains and success stones, but for a longer term, could be a costly proposition
  • Keywords
    environmental testing; failure analysis; product development; reliability; testing; field reliability impact; new product introduction process; reliability assessment; reliability stress test method; time to market; Fatigue; Life estimation; Life testing; Manufacturing; Product design; Product development; Stress; Test equipment; Time to market; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2002. Proceedings. Annual
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-7348-0
  • Type

    conf

  • DOI
    10.1109/RAMS.2002.981663
  • Filename
    981663