DocumentCode :
2209704
Title :
Reliability stress test method: impact on the new product introduction process, time to market, field reliability impact and reliability assessment
Author :
Jawaid, S. ; Ferguson, Jon ; Zaki, Seifi
Author_Institution :
BigBear Networks, Milpitas, CA, USA
fYear :
2002
fDate :
2002
Firstpage :
332
Lastpage :
337
Abstract :
A comprehensive reliability stress test program is not a trivial undertaking. The shake and bake approach without a complete understanding of the failure modes and mechanisms, the design and technology limitations and potential, and the reliability objectives may buy a few short term gains and success stones, but for a longer term, could be a costly proposition
Keywords :
environmental testing; failure analysis; product development; reliability; testing; field reliability impact; new product introduction process; reliability assessment; reliability stress test method; time to market; Fatigue; Life estimation; Life testing; Manufacturing; Product design; Product development; Stress; Test equipment; Time to market; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2002. Proceedings. Annual
Conference_Location :
Seattle, WA
ISSN :
0149-144X
Print_ISBN :
0-7803-7348-0
Type :
conf
DOI :
10.1109/RAMS.2002.981663
Filename :
981663
Link To Document :
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