DocumentCode :
2209724
Title :
Ionic Stress Technique with Individual Vt Measurements on a 144 K SRAM
Author :
Watson, Kimball M.
Author_Institution :
IBM Microelectronics
fYear :
1993
fDate :
24-27 Oct 1993
Firstpage :
35
Lastpage :
39
Keywords :
Circuit testing; Contamination; Current measurement; Inverters; Microelectronics; Pollution measurement; Random access memory; Semiconductor device measurement; Stress measurement; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 1993 International
Type :
conf
DOI :
10.1109/IRWS.1993.666289
Filename :
666289
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2209724
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