DocumentCode
2209903
Title
Assessment of the rod-pinch as a 1-2 MV radiography source on the NRL Gamble II generator
Author
Stephanakis, S.J. ; Commisso, R.J. ; Cooperstein, G. ; Mosher, D. ; Neri, J.M. ; Young, F.C. ; Carlson, R.L. ; Fulton, R.D. ; Oro, D.M. ; Ulibarri, M.D. ; Hunt, E.E. ; Droemer, D.W.
Author_Institution
Naval Res. Lab., Washington, DC, USA
fYear
2000
fDate
4-7 June 2000
Firstpage
231
Abstract
Summary form only given. A cylindrical pinched beam diode operating in the 1-2 MV, 30-60 kA, 25-50 ns (FWHM) range, was fielded on the Gamble II generator in order to assess the suitability of the resulting pinch as an X-ray source for high resolution radiography. The diode incorporated a 3.2 mm-long, 11 mm-diameter graphite cathode and a 1 mm-diameter tungsten anode that extended 1.6 cm beyond the cathode and was tapered to a point over 1 cm. Electrons emitted from the cathode are bent by their self magnetic field and subsequently pinch onto the tip of the anode producing a small, intense bremsstrahlung source. The generator (a 2-Ohm machine) was configured with parallel loads that carried the bulk of the available current during the pulse. Radiation from the parallel-load diodes was attenuated with lead shielding. In addition, specially designed resolution targets and two test objects were radiographed and their projected images analyzed to validate the source quality. The source size inferred from these images is consistent with the 1 mm spot size deduced from the more traditional and historic rolled-edge technique.
Keywords
X-ray imaging; X-ray production; bremsstrahlung; pinch effect; radiography; 1 mm; 1 to 2 MV; 1.6 cm; 11 mm; 25 to 50 ns; 3.2 mm; 30 to 60 kA; Gamble II generator; NRL Gamble II generator; W; W anode; X-ray source; anode; cathode; cylindrical pinched beam diode; high resolution radiography; images; lead shielding; parallel loads; parallel-load diodes; projected images; radiography source; resolution targets; rod-pinch; rolled-edge technique; self magnetic field; small intense bremsstrahlung source; source quality; source size; test objects; Anodes; Cathodes; Diodes; Electron emission; Image resolution; Magnetic shielding; Pulse generation; Radiography; Testing; Tungsten;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location
New Orleans, LA, USA
ISSN
0730-9244
Print_ISBN
0-7803-5982-8
Type
conf
DOI
10.1109/PLASMA.2000.855061
Filename
855061
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