DocumentCode :
2210180
Title :
Evidence for a Correct SiO2 Voltage Acceleration Model
Author :
Miller, W.M. ; Messick, C. ; Smith, N.F. ; Shideler, J.A.
Author_Institution :
Sandia National Laboratories
fYear :
1993
fDate :
24-27 Oct 1993
Firstpage :
45
Lastpage :
51
Keywords :
Acceleration; Capacitors; Electric breakdown; Electronic mail; Extrapolation; Laboratories; Semiconductor device breakdown; Semiconductor device modeling; System testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 1993 International
Type :
conf
DOI :
10.1109/IRWS.1993.666291
Filename :
666291
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2210180
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