Title :
DMILL, a mixed analog-digital radiation-hard BICMOS technology for high energy physics electronics
Author :
Dentan, M. ; Abbon, P. ; Borgeaud, P. ; Delagnes, E. ; Fourches, N. ; Lachartre, D. ; Lugiez, F. ; Paul, B. ; Rouger, M. ; Truche, R. ; Blanc, J.P. ; Leroux, C. ; Delevoye-Orsier, E. ; Pelloie, JL ; de Pontcharra, J. ; Flament, O. ; Guebbard, J. ; Leray,
Author_Institution :
CEA, Centre d´´Etudes Nucleaires de Saclay, Gif-sur-Yvette, France
Abstract :
High energy physics experiments under preparation at CERN (Geneva, Switzerland) with the future LHC (Large Hadron Collider) require a fast, low noise, very rad-hard, mixed analog-digital microelectronics VLSI technology. Readout electronics designed using such a technology for the central parts of the LHC particle detectors must withstand more than 10 Mrad (SiO2) and 1014 neutrons/cm2 over 10 years of operation. We are presenting here recent results obtained with a new rad-hard analog-digital technology called DMILL, which monolithically integrates NPN bipolar, CMOS and P-JFET transistors, and which has been specifically developed to fulfil the severe constraints of LHC detectors readout circuits
Keywords :
BiCMOS integrated circuits; colliding beam accelerators; detector circuits; integrated circuit technology; mixed analogue-digital integrated circuits; neutron detection; nuclear electronics; proton accelerators; radiation hardening (electronics); semiconductor counters; storage rings; synchrotrons; 10 year; CMOS transistors; DMILL; LHC particle detectors; Large Hadron Collider; NPN bipolar transistors; P-JFET transistors; SiO2; high energy physics electronics; low noise VLSI technology; mixed analog-digital radiation-hard BICMOS technology; neutrons; readout circuits; Analog-digital conversion; BiCMOS integrated circuits; CMOS technology; Large Hadron Collider; Microelectronics; Neutrons; Radiation detectors; Radiation hardening; Readout electronics; Very large scale integration;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3180-X
DOI :
10.1109/NSSMIC.1995.510373
