• DocumentCode
    2210335
  • Title

    A model-based regression test selection technique

  • Author

    Naslavsky, Leila ; Ziv, Hadar ; Richardson, Debra J.

  • Author_Institution
    Donald Bren Sch. of Inf. & Comput. Sci., Univ. of California, Irvine, CA, USA
  • fYear
    2009
  • fDate
    20-26 Sept. 2009
  • Firstpage
    515
  • Lastpage
    518
  • Abstract
    Throughout their life cycle, software artifacts are modified, and selective regression testing is used to identify the negative impact of modifications. Code-based regression test selection retests test cases sub-set that traverse code modifications. It uses recovered relationships between code parts and test cases that traverse them to locate test cases for retest when code is modified. Broad adoption of model-centric development has created opportunities for software testing. It enabled driving testing processes at higher abstraction levels and demonstrating code to model compliance by means of Model-Based Testing (MBT). Models also evolve, so an important activity of MBT is selective regression testing. It selects test cases for retest based on model modification, so it relies on relationships between model elements and test cases that traverse those elements to locate test cases for retest. We contribute an approach and prototype that during test case generation creates fine-grained traceability relationships between model elements and test cases, which are used to support model-based regression test selection.
  • Keywords
    program testing; regression analysis; code-based regression test selection technique; model-based regression test selection; model-based testing; selective regression testing; software artifacts; software testing; test case generation; Analytical models; Automatic testing; Drives; Information analysis; Life testing; Prototypes; Software quality; Software systems; Software testing; Unified modeling language;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Maintenance, 2009. ICSM 2009. IEEE International Conference on
  • Conference_Location
    Edmonton, AB
  • ISSN
    1063-6773
  • Print_ISBN
    978-1-4244-4897-5
  • Electronic_ISBN
    1063-6773
  • Type

    conf

  • DOI
    10.1109/ICSM.2009.5306338
  • Filename
    5306338