DocumentCode :
2210470
Title :
Analyzing fuzziness in product quality and reliability information-flow during time-driven product-development-process
Author :
Lu, Yuan ; Brombacher, Aarnout C. ; Ouden, Elke Den ; Körvers, Patrick M W
Author_Institution :
Eindhoven Univ. of Technol., Netherlands
fYear :
2002
fDate :
2002
Firstpage :
496
Lastpage :
502
Abstract :
This paper provides a different angle to look at quality and reliability (Q&R) problem prediction in a time-driven product development process (PDP) where the Q&R information is highly uncertain. Through a case study, it is demonstrated that many of the critical Q&R problems in such a product development cannot be predicted due to highly fuzzy Q&R information. Therefore, a new tool, the reliability and quality matrix (RQM), was developed to overcome this difficulty. It is shown that RQM can not only quantitatively indicate the severity level of an identified Q&R problem but also reflect on its associated uncertainty level due to fuzzy Q&R information. RAM was developed as an enhancement of failure mode effect analysis (FMEA) or quality function deployment (QFD). If the quality of the input information is very good, RQM then presents only the results from FMEA or QFD. However, if uncertainty in the input information is obviously high, RQM can act as uncertainty/fuzziness reduction tool to strengthen the weakness of FMEA and QFD when dealing with fuzzy information
Keywords :
failure analysis; product development; quality control; reliability; FMEA; case study; failure mode effect analysis; fuzziness analysis; product quality & reliability information flow; quality function deployment; reliability and quality matrix; time-driven product development process; Consumer electronics; Customer satisfaction; Failure analysis; Information analysis; Product development; Quality function deployment; Research and development; Technological innovation; Time to market; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2002. Proceedings. Annual
Conference_Location :
Seattle, WA
ISSN :
0149-144X
Print_ISBN :
0-7803-7348-0
Type :
conf
DOI :
10.1109/RAMS.2002.981693
Filename :
981693
Link To Document :
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