DocumentCode
2210470
Title
Analyzing fuzziness in product quality and reliability information-flow during time-driven product-development-process
Author
Lu, Yuan ; Brombacher, Aarnout C. ; Ouden, Elke Den ; Körvers, Patrick M W
Author_Institution
Eindhoven Univ. of Technol., Netherlands
fYear
2002
fDate
2002
Firstpage
496
Lastpage
502
Abstract
This paper provides a different angle to look at quality and reliability (Q&R) problem prediction in a time-driven product development process (PDP) where the Q&R information is highly uncertain. Through a case study, it is demonstrated that many of the critical Q&R problems in such a product development cannot be predicted due to highly fuzzy Q&R information. Therefore, a new tool, the reliability and quality matrix (RQM), was developed to overcome this difficulty. It is shown that RQM can not only quantitatively indicate the severity level of an identified Q&R problem but also reflect on its associated uncertainty level due to fuzzy Q&R information. RAM was developed as an enhancement of failure mode effect analysis (FMEA) or quality function deployment (QFD). If the quality of the input information is very good, RQM then presents only the results from FMEA or QFD. However, if uncertainty in the input information is obviously high, RQM can act as uncertainty/fuzziness reduction tool to strengthen the weakness of FMEA and QFD when dealing with fuzzy information
Keywords
failure analysis; product development; quality control; reliability; FMEA; case study; failure mode effect analysis; fuzziness analysis; product quality & reliability information flow; quality function deployment; reliability and quality matrix; time-driven product development process; Consumer electronics; Customer satisfaction; Failure analysis; Information analysis; Product development; Quality function deployment; Research and development; Technological innovation; Time to market; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2002. Proceedings. Annual
Conference_Location
Seattle, WA
ISSN
0149-144X
Print_ISBN
0-7803-7348-0
Type
conf
DOI
10.1109/RAMS.2002.981693
Filename
981693
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