A failure-forecast method based on Weibull and statistical-pattern analysis

This paper presents a method that combines Weibull analysis and statistical algorithms to forecast failures, and the experimental results applied to electronic systems. The Weibull analysis is a classical method to forecast failures using risk analysis and the mean-time-to-failure (MTTF) parameter. Statistical pattern analysis can forecast failures based on performance information from the component. Performance can be monitored by analyzing test data collected during the system or component´s operating life. Weibull analysis uses failure datum to estimate the MTTF. Statistical pattern analysis uses test data to identify statistical patterns such as trend lines