Title :
Atom-based RF electric field measurements: An initial investigation of the measurement uncertainties
Author :
Holloway, Christopher L. ; Gordon, Joshua A. ; Simons, Matt T. ; Fan, Haoquan ; Kumar, Santosh ; Shaffer, James P. ; Anderson, David A. ; Schwarzkopf, Andrew ; Miller, Stephanie A. ; Thaicharoen, Nithiwadee ; Raithel, Georg
Author_Institution :
National Institute of Standards and Technology (NIST), Electromagnetics Division, 325 Broadway, Boulder, CO 80305, USA
Abstract :
We discuss a new method for the measurement of electric (E) fields that will lead to a self-calibrating, direct SI-traceable E-field probe. The technique is based on radio frequency E-field interactions with alkali atoms placed in glass cells. After we present the concept of this approach and present some experimental data to show its validity, we give a discussion of the different types of uncertainties that are associated with this new approach. We discuss how the uncertainties of this approach compare to commonly used E-field measurement techniques.
Keywords :
Atomic beams; Atomic clocks; Atomic measurements; Measurement uncertainty; Probes; Radio frequency; Uncertainty;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4799-6615-8
DOI :
10.1109/ISEMC.2015.7256207
