DocumentCode :
2210591
Title :
Reliability predictions based on criticality-associated similarity analysis
Author :
Jackson, Alazel ; Jain, Aridaman K. ; Jackson, Tyrone
Author_Institution :
California State Univ., Long Beach, CA, USA
fYear :
2002
fDate :
2002
Firstpage :
528
Lastpage :
535
Abstract :
In this paper, the authors describe a methodology that they call criticality-associated similarity analysis (CASA), which systematically develops a reliability prediction by applying the following empirical-based conjecture: the ratio of predicted to demonstrated reliability for a new product (i.e., a product that has never been placed in-service) is equal to the corresponding ratio for a similar in-service product that has both its predicted and demonstrated reliabilities adjusted to reflect all the failure and sneak modes, mechanisms, and root causes of the new product. The CASA methodology is practical and efficient when there is newly designed electronics equipment that is sufficiently similar to in-service electronics equipment that has a demonstrated reliability. The application of this methodology will result in a reliability prediction that is more precise than those obtained by using traditional reliability prediction methodologies
Keywords :
failure analysis; product development; quality control; reliability; criticality-associated similarity analysis; in-service electronics equipment; new products; quality assurance; reliability predictions; Availability; Circuit testing; Costs; Data analysis; Electronic equipment; Failure analysis; Life testing; Materials reliability; Standards Coordinating Committees; Statistical analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2002. Proceedings. Annual
Conference_Location :
Seattle, WA
ISSN :
0149-144X
Print_ISBN :
0-7803-7348-0
Type :
conf
DOI :
10.1109/RAMS.2002.981698
Filename :
981698
Link To Document :
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