DocumentCode
2210591
Title
Reliability predictions based on criticality-associated similarity analysis
Author
Jackson, Alazel ; Jain, Aridaman K. ; Jackson, Tyrone
Author_Institution
California State Univ., Long Beach, CA, USA
fYear
2002
fDate
2002
Firstpage
528
Lastpage
535
Abstract
In this paper, the authors describe a methodology that they call criticality-associated similarity analysis (CASA), which systematically develops a reliability prediction by applying the following empirical-based conjecture: the ratio of predicted to demonstrated reliability for a new product (i.e., a product that has never been placed in-service) is equal to the corresponding ratio for a similar in-service product that has both its predicted and demonstrated reliabilities adjusted to reflect all the failure and sneak modes, mechanisms, and root causes of the new product. The CASA methodology is practical and efficient when there is newly designed electronics equipment that is sufficiently similar to in-service electronics equipment that has a demonstrated reliability. The application of this methodology will result in a reliability prediction that is more precise than those obtained by using traditional reliability prediction methodologies
Keywords
failure analysis; product development; quality control; reliability; criticality-associated similarity analysis; in-service electronics equipment; new products; quality assurance; reliability predictions; Availability; Circuit testing; Costs; Data analysis; Electronic equipment; Failure analysis; Life testing; Materials reliability; Standards Coordinating Committees; Statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2002. Proceedings. Annual
Conference_Location
Seattle, WA
ISSN
0149-144X
Print_ISBN
0-7803-7348-0
Type
conf
DOI
10.1109/RAMS.2002.981698
Filename
981698
Link To Document