• DocumentCode
    2210591
  • Title

    Reliability predictions based on criticality-associated similarity analysis

  • Author

    Jackson, Alazel ; Jain, Aridaman K. ; Jackson, Tyrone

  • Author_Institution
    California State Univ., Long Beach, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    528
  • Lastpage
    535
  • Abstract
    In this paper, the authors describe a methodology that they call criticality-associated similarity analysis (CASA), which systematically develops a reliability prediction by applying the following empirical-based conjecture: the ratio of predicted to demonstrated reliability for a new product (i.e., a product that has never been placed in-service) is equal to the corresponding ratio for a similar in-service product that has both its predicted and demonstrated reliabilities adjusted to reflect all the failure and sneak modes, mechanisms, and root causes of the new product. The CASA methodology is practical and efficient when there is newly designed electronics equipment that is sufficiently similar to in-service electronics equipment that has a demonstrated reliability. The application of this methodology will result in a reliability prediction that is more precise than those obtained by using traditional reliability prediction methodologies
  • Keywords
    failure analysis; product development; quality control; reliability; criticality-associated similarity analysis; in-service electronics equipment; new products; quality assurance; reliability predictions; Availability; Circuit testing; Costs; Data analysis; Electronic equipment; Failure analysis; Life testing; Materials reliability; Standards Coordinating Committees; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2002. Proceedings. Annual
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-7348-0
  • Type

    conf

  • DOI
    10.1109/RAMS.2002.981698
  • Filename
    981698