• DocumentCode
    2210965
  • Title

    Improvement in EIT image reconstruction by using double FEM mesh

  • Author

    Ulgen, Yekta ; Gokgoz, M. Burgh

  • Author_Institution
    Inst. of Biomed. Eng., Bogazici Univ., Istanbul, Turkey
  • Volume
    2
  • fYear
    1996
  • fDate
    31 Oct-3 Nov 1996
  • Firstpage
    802
  • Abstract
    We propose the use or two separate meshes; one (line with 1408 elements) to model the potentials more accurately in the forward problem, the other (coarse with 88 elements) to model the inverse problem conductivity distribution. Static images are reconstructed using Gaussian noise added Ankara standard data set with the Newton-Raphson algorithm. The quality of the images is evaluated in terms of spatial resolution calculated as the full-width-half-maximum, for single and double, conducting and insulating objects at different positions along the diameter. Results show that better images are reconstructed with lower error end an Increase in resolution does appear to be achieved. Although the method proposed has been used in other arena of imaging, it is difficult to find an explicit description of this method in the literature so in this sense the suggestion is novel
  • Keywords
    Gaussian noise; electric impedance imaging; image reconstruction; inverse problems; medical image processing; mesh generation; tomography; Gaussian noise added Ankara standard data set; Newton-Raphson algorithm; diameter; double conducting objects; double finte element method mesh; electric impedance tomography image reconstruction; forward problem; full-width-half-maximum; inverse problem conductivity distribution; single insulating objects; spatial resolution; static images; Biomedical engineering; Conductivity; Electrodes; Gaussian noise; Image reconstruction; Image resolution; Inverse problems; Spatial resolution; Tomography; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
  • Conference_Location
    Amsterdam
  • Print_ISBN
    0-7803-3811-1
  • Type

    conf

  • DOI
    10.1109/IEMBS.1996.651984
  • Filename
    651984