Title :
Detection of 90Sr/90Y with Cherenkov radiation
Author :
Brajnik, D. ; Korpar, S. ; Medin, G. ; Staric, M. ; Stanovnik, A.
Author_Institution :
Jozef Stefan Inst., Ljubljana Univ., Slovenia
Abstract :
The highly radiotoxic 90Sr cannot be determined by γ-spectrometry as 90Sr and its daughter 90Y are both pure β-emitters. Cherenkov radiation of the relatively high energy β-particles from 90Y (Eβmax=2.27 MeV) allows for discrimination or at least for strong suppression of the lower energy β-emitters. The contribution of both may then be determined from 90Y if their ratio is known. Measurements of efficiencies with a silica aerogel radiator (n=1.055), show a steep dependence on the β end-point energy above threshold (Eβth=1.09 MeV). Possible contributions from β-emitters other than 90Y in the sample may be detected by the shape of the pulse height spectrum. Using a multiwire proportional chamber in coincidence and plastic scintillation counters in anticoincidence reduces the background, so environmental activities down to about 1 Bq of 90Sr/90 Y may be detected in a few hours of measurement of a thin sample (air filter or sediment)
Keywords :
Cherenkov radiation; air pollution measurement; beta-ray detection; beta-ray spectrometers; beta-ray spectroscopy; coincidence techniques; multiwire proportional chambers; proportional counters; radiation monitoring; radioactive pollution; solid scintillation detectors; strontium; yttrium; β end-point energy; 1.09 MeV; 2.27 MeV; 90Sr detection; 90Y detection; Cherenkov radiation; Sr; Y; air filter; anticoincidence; coincidence; environmental activities; high energy β-particles; multiwire proportional chamber; plastic scintillation counters; pulse height spectrum; pure β-emitters; sediment; silica aerogel radiator; thin sample; Air cleaners; Energy measurement; Plastics; Pulse shaping methods; Scintillation counters; Sediments; Shape; Silicon compounds; Solid scintillation detectors; Strontium;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3180-X
DOI :
10.1109/NSSMIC.1995.510400