DocumentCode :
2211095
Title :
Hg 185 nm and 254 nm resonance radiation production from a low pressure Hg-Ar discharge at high current densities
Author :
Curry, J.J. ; Lawler, J.E. ; Lister, G.G.
Author_Institution :
Dept. of Phys., Wisconsin Univ., WI, USA
fYear :
2000
fDate :
4-7 June 2000
Firstpage :
255
Abstract :
Summary form only given. The power radiated by each of the 185 nm and 254 nm resonance lines of Hg as a fraction of input power per unit length to the positive column has been measured in a low pressure Hg-Ar discharge. Measurements were obtained over a range of current densities from approximately 0.05 A cm/sup -2/ to approximately 0.6 A cm/sup -2/. These measurements are thus relevant to a wide range of fluorescent lamp applications, from a \´standard\´ 32 Watt T8 fluorescent lamp (0.05 A cm/sup -2/) to the new generation of "electrodeless" fluorescent lamps, which operate at considerably higher current densities. Radiated power was determined by combining accurate measurements of the 6 /sup 1/P/sub 1/ and 6 /sup 3/P/sub 1/ resonance level populations with realistic Monte Carlo simulations of radiation transport/sup 2/. This method eliminates the need for direct UV/VUV radiometry, which requires a reliable \´standard of irradiance.\´ This and other problems are particularly acute at 185 nm. Resonance level populations were measured using high sensitivity absorption spectroscopy.
Keywords :
argon; digital simulation; discharges (electric); mercury (metal); plasma simulation; plasma transport processes; positive column; resonant states; 185 nm; 254 nm; 32 W; 6 /sup 1/P/sub 1/ resonance level population; 6 /sup 3/P/sub 1/ resonance level population; Hg-Ar; Monte Carlo simulations; T8 fluorescent lamp; current densities; electrodeless fluorescent lamps; high sensitivity absorption spectroscopy; input power per unit length; low pressure Hg-Ar discharge; positive column; power radiation; resonance lines; resonance radiation; Current density; Current measurement; Density measurement; Fluorescent lamps; Length measurement; Mercury (metals); Power measurement; Pressure measurement; Production; Resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-5982-8
Type :
conf
DOI :
10.1109/PLASMA.2000.855104
Filename :
855104
Link To Document :
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