DocumentCode :
2211155
Title :
Using rectangular-patches (RPs) to reduce far-end crosstalk noise and improve eye-diagrams on microstrip helix delay line
Author :
Lin, Ding-Bing ; Huang, Chung-Pin ; Lin, Chih-Hao ; Ke, Hsin-Nan ; Liu, Wen-Sheng
Author_Institution :
Department of Electronic Engineering, National Taipei University of Technology, Taiwan
fYear :
2015
fDate :
16-22 Aug. 2015
Firstpage :
612
Lastpage :
615
Abstract :
Delay lines are widely employed in high-speed circuit for delay time synchronization and timing skew minimization, popular schemes are serpentine and spiral routing. In order to reduce the manufacture cost and routing area, spacing between adjacent unit lines should be smaller, but it increases in electromagnetic coupling and crosstalk from adjacent lines. In conventional serpentine and spiral delay lines, near-end crosstalk (NEXT) is a main noise that accumulates at the receiving end and results in waveform degradation of time-domain transmission (TDT). Although there are many strategies for crosstalk noise reduction, yet the crosstalk noise like NEXT always exists and may affect system-level timing and cause error switching of logic gates. This paper proposes two novel structures; one is helix delay line, and the other is helix delay line with rectangular-patches (RPs). Compared with conventional serpentine and spiral delay lines, the far-end crosstalk (FEXT) is a dominant noise that accumulates at the receiving end. Simulation results show that FEXT noise in helix delay line with RPs structure can dramatically decrease 77.6%, eye-opening and eye-jitter can improve 28% and 33.4% compared with helix delay line without RPs.
Keywords :
Couplings; Crosstalk; Delay lines; Microstrip; Noise; Routing; Spirals; far-end crosstalk (FEXT); helix delay line; near-end crostalk (NEXT); rectandular-patches (RPs); serpentine and spiral delay lines; time-domain transmission (TDT);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4799-6615-8
Type :
conf
DOI :
10.1109/ISEMC.2015.7256233
Filename :
7256233
Link To Document :
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