DocumentCode
2211267
Title
A study of intensify the power of verification for memory worst case conditions through the SI analysis
Author
Lee, Chang-Ik ; Kim, Mi-Ro
Author_Institution
CAE Team in the Hyundai Mobis, Yongin-Si, Korea
fYear
2015
fDate
16-22 Aug. 2015
Firstpage
640
Lastpage
644
Abstract
Electrical units of vehicle are installed in the harsh environment and we need to effectively verify in the step of pre-verify in order to minimize field defects. In this paper, we considered various worst case of memory communication conditions to intensify the power of verification and verified the effectiveness.
Keywords
Jitter; Standards; DC-DC Converter; DDR; Jitter; Ripple; Surge;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location
Dresden, Germany
Print_ISBN
978-1-4799-6615-8
Type
conf
DOI
10.1109/ISEMC.2015.7256238
Filename
7256238
Link To Document