• DocumentCode
    2211537
  • Title

    Charge transport and persistent conduction in high gain photoconductive semiconductor switches used in pulsed power applications

  • Author

    Islam, Naz E. ; Schamiloglu, Edl

  • Author_Institution
    Dept. of Electr. & Comput. Eng., New Mexico Univ., Albuquerque, NM, USA
  • fYear
    2000
  • fDate
    4-7 June 2000
  • Firstpage
    265
  • Abstract
    Summary form only given. High gain photoconductivity semiconductor switches (PCSS´s) used in pulsed power applications usually have deep level impurities in high concentration that are normally utilized in the compensation processes that make the devices semi-insulating (SI). The overall resistivity of these switches is thus improved and the devices have higher hold-off voltages. Depending on the bias applied, the conduction mechanisms in these devices also vary. Some of these devices continue to conduct even after the elimination of the optical source. In this presentation we analyze the behavior of optically triggered high gain GaAs PCSS, and discuss the nature of conduction at high and very high bias conditions, presenting a model for the persistent conduction of the switches after the withdrawal of the trigger source. The analysis takes into account GaAs specific inter-valley charge transfer properties, negative resistivity, field-assisted charge trapping and de-trapping, and impact ionization to give a model that can explain the physical processes during conduction. Experimental and modeling results of PCSS´s used in generating ultra wideband (UWB) high power microwaves (HPM) are used in our analysis. The devices analyzed consist of 1.2/spl times/1 cm opposed contact PCSS´s that were fabricated from GaAs that has a high concentration of EL2 traps at the mid-gap level. The device I-V characteristics were generated at the AFRL Laboratories, while the simulation studies were carried out at the University of New Mexico using the SILVACO semiconductor simulation code. The GaAs PCSS used in the simulation was generated through an interface with the BLAZE module that simulates III-V semiconductor devices. Our study shows that the characteristics of the PCSS can be affected by the impurity concentration, specifically those at the deep level where the EL2 donor (>10/sup 16//cm/sup 3/) sites dominate.
  • Keywords
    carrier mobility; charge exchange; digital simulation; electrical conductivity; impurities; photoconducting switches; BLAZE module; EL2 donor sites; EL2 traps; GaAs; GaAs specific inter-valley charge transfer properties; III-V semiconductor devices; SILVACO semiconductor simulation code; bias conditions; charge de-trapping; charge transport; compensation processes; conduction mechanisms; deep level; deep level impurities; device I-V characteristics; field-assisted charge trapping; high gain photoconductive semiconductor switches; high gain photoconductivity semiconductor switches; hold-off voltages; impact ionization; impurity concentration; impurity concentrations; interface; mid-gap level; negative resistivity; optical source; optically triggered high gain GaAs PCSS; overall resistivity; persistent conduction; pulsed power applications; trigger source; ultra wideband high power microwaves; Charge transfer; Conductivity; Gallium arsenide; High power microwave generation; Optical devices; Optical switches; Photoconductivity; Power semiconductor switches; Semiconductor impurities; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
  • Conference_Location
    New Orleans, LA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-5982-8
  • Type

    conf

  • DOI
    10.1109/PLASMA.2000.855123
  • Filename
    855123