DocumentCode :
2211603
Title :
Studies to improve performance of Maxwell ATLAS rail-gap switches
Author :
Guy, T.L. ; Freeman, B.L.
Author_Institution :
Texas A&M Univ., College Station, TX, USA
fYear :
2000
fDate :
4-7 June 2000
Firstpage :
267
Abstract :
Summary form only given. This work reports on experimental tests aimed at improving the operation of Maxwell ATLAS rail-gap switches. The present switches are demonstrated to have a decreased maintenance cycle relative to the former, epoxy-body, rail-gap switch. The cause is UV degradation of the polyurethane switch housing. Experimental tests using a UV coating are performed in an effort to extend the maintenance cycle greater than the average 160 discharges. The standard gas used in rail-gap switches is a mixture of (85% Ar/15% SF/sub 6/). The ATLAS switch has a limited flexibility for changing the switch gap. Thus it is highly desirable to extend the operating voltage of a given gap setting by using different gas mixtures. We explored this possibility by performing self-break tests using various gas mixtures, including (90%, Ar/10% O/sub 2/), (95% Ar/5% O/sub 2/), (60% Ar/40% He), (60% Ar/35% He/5% SF/sub 6/) and (80% Ar/15% He/5% SF/sub 6/). It is worth noting that the (90% Ar/10% O/sub 2/) mixture has been used previously to lower the operating voltage in earlier switches. The possibilities of increasing maintenance service cycles and of extending the voltage-operating region with a fixed gap using different gas mixtures are reported.
Keywords :
plasma switches; switchgear; ATLAS switch; Ar-He; Ar-He-SF/sub 6/; Ar-O/sub 2/; Ar-SF/sub 6/; Maxwell ATLAS rail-gap switches; degradation; fixed gap; gas mixtures; maintenance cycle; operating voltage; polyurethane switch housing; self-break tests; voltage-operating region; Argon; Automatic testing; Coatings; Degradation; Helium; Particle beams; Performance evaluation; Sulfur hexafluoride; Switches; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-5982-8
Type :
conf
DOI :
10.1109/PLASMA.2000.855126
Filename :
855126
Link To Document :
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