Title :
Test error bounds for classifiers: A survey of old and new results
Author :
Anguita, Davide ; Ghelardoni, Luca ; Ghio, Alessandro ; Ridella, Sandro
Author_Institution :
DIBE, Univ. of Genova, Genova, Italy
Abstract :
In this paper, we focus the attention on one of the oldest problems in pattern recognition and machine learning: the estimation of the generalization error of a classifier through a test set. Despite this problem has been addressed for several decades, the last word has not yet been written, as new proposals continue to appear in the literature. Our objective is to survey and compare old and new techniques, in terms of quality of the estimation, easiness of use, and rigorousness of the approach.
Keywords :
generalisation (artificial intelligence); learning (artificial intelligence); pattern classification; classifier error; generalization error estimation; machine learning; pattern recognition; test error bounds; Chebyshev approximation; Error analysis; Estimation; Gaussian distribution; Training; Upper bound;
Conference_Titel :
Foundations of Computational Intelligence (FOCI), 2011 IEEE Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-9981-6
DOI :
10.1109/FOCI.2011.5949469