• DocumentCode
    2211877
  • Title

    ZnO nanorods for electronic nanodevice applications

  • Author

    Yi, Gyu-Chul ; Park, Won Il ; Kim, H.J. ; Lee, C.-H.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. CRI Center for Semicond. Nanorods, Pohang
  • Volume
    1
  • fYear
    2006
  • fDate
    22-25 Oct. 2006
  • Firstpage
    164
  • Lastpage
    165
  • Abstract
    We report on fabrications and characteristics of high performance ZnO nanorod nanodevices including Schottky diodes, metal-oxide-semiconductor field-effect transistors (MOSFETs), metal-semiconductor field-effect transistors (MESFETs) and logic gate devices. In particular, after coating polymer thin films on ZnO nanorod surfaces, the nanorod MOSFETs exhibited much improved field effect transistor characteristics including field effect electron mobility as high as 3000 cm2/Vs. In addition, ZnO nanorod Schottky diodes and MESFETs were fabricated using Au/ZnO Schottky contacts without any specific oxide etching process, further resulting in realization of ZnO nanorod logic gates.
  • Keywords
    II-VI semiconductors; MOSFET; Schottky barriers; Schottky diodes; Schottky gate field effect transistors; electron mobility; gold; logic gates; nanoelectronics; nanostructured materials; polymer films; zinc compounds; Au-ZnO; Au-ZnO - Interface; MESFET; MOSFET; Schottky contacts; Schottky diodes; ZnO; ZnO - Interface; ZnO nanorod nanodevices; electronic nanodevice applications; field effect electron mobility; field effect transistor characteristics; logic gate devices; metal-oxide-semiconductor field-effect transistors; metal-semiconductor field-effect transistors; nanodevice fabrication; polymer thin film coating; Coatings; FETs; Fabrication; Logic devices; Logic gates; MESFETs; MOSFETs; Nanoscale devices; Schottky diodes; Zinc oxide; Schottky didoes; ZnO nanorods; field effect transistors (FETs); logic gates; nanodevice;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE
  • Conference_Location
    Gyeongju
  • Print_ISBN
    978-1-4244-0540-4
  • Electronic_ISBN
    978-1-4244-0541-1
  • Type

    conf

  • DOI
    10.1109/NMDC.2006.4388728
  • Filename
    4388728