DocumentCode :
2211898
Title :
NMR in a point contact device
Author :
Hirayama, Yoshiro
Author_Institution :
Tohoku Univ., Sendai
Volume :
1
fYear :
2006
fDate :
22-25 Oct. 2006
Firstpage :
166
Lastpage :
167
Abstract :
Resistively-detected and ultra-sensitive nuclear magnetic resonance (NMR), which is suitable for high-mobility semiconductor hetero and nanostructures, has been developed. Fractional quantum hall physics enables us to dynamically polarize nuclear spins in a two-and one-dimensional channel and to detect the nuclear spin polarization by measuring the channel resistance. When an alternating magnetic field is applied to the channel, the coherent oscillation occurs for the nuclear spins that resonate with this magnetic field, resulting in the channel resistance oscillation. For a point contact device, all possible coherent oscillations have been successfully detected between two levels from four nuclear spin states of I=3/2 nuclei for both Ga and As. The number of nuclei in the point contact region is under 108, witch is 3 to 5 orders of magnitude smaller than the sensitivity limit of standard NMR technology. Furthermore, a relaxation of nuclear spins has been used as a sensitive detector of electron spin states.
Keywords :
nuclear magnetic resonance; nuclear spin; quantum Hall effect; quantum point contacts; spin-spin relaxation; NMR; channel resistance oscillation; coherent oscillation; electron spin states; fractional quantum hall physics; high mobility semiconductor heterostructures; nanostructures; nuclear magnetic resonance; nuclear spin polarization; nuclear spins; point contact device; sensitive detector; Electrons; Gallium arsenide; Immune system; Magnetic field measurement; Magnetic resonance imaging; Nuclear magnetic resonance; Physics; Polarization; Quantum computing; Semiconductor nanostructures; GaAs; NMR; fractional quantum Hall effect; hererostructure; point contact;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE
Conference_Location :
Gyeongju
Print_ISBN :
978-1-4244-0541-1
Electronic_ISBN :
978-1-4244-0541-1
Type :
conf
DOI :
10.1109/NMDC.2006.4388729
Filename :
4388729
Link To Document :
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