• DocumentCode
    2211994
  • Title

    Latest advances in nanomaterial characterisation: from the micron scale to the atom scale

  • Author

    Horréard, F. ; Hillion, F. ; Renaud, L. ; Schuhmacher, M.

  • Author_Institution
    CAMECA, Gennevilliers
  • Volume
    1
  • fYear
    2006
  • fDate
    22-25 Oct. 2006
  • Firstpage
    174
  • Lastpage
    175
  • Abstract
    This paper concentrates on the recent developments or breakthroughs of two main analytical techniques used in the field : SIMS and atom probe.
  • Keywords
    nanostructured materials; nanotechnology; secondary ion mass spectroscopy; SIMS technique; atom probe technique; nanomaterial characterisation; Atomic beams; Atomic layer deposition; Atomic measurements; Chemical elements; Energy resolution; Instruments; Ionization; Lenses; Nanotechnology; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE
  • Conference_Location
    Gyeongju
  • Print_ISBN
    978-1-4244-0541-1
  • Electronic_ISBN
    978-1-4244-0541-1
  • Type

    conf

  • DOI
    10.1109/NMDC.2006.4388733
  • Filename
    4388733
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2211994