Title :
Long-term Ageing Test Results of Various Kinds of Semi-conducting Glaze Insulators
Author :
Muto, Atsushi ; Yoshikawa, Masaki ; Mizuno, Takuya ; Kawaguchi, Toshiyuki ; Matsuoka, Ryosuke
Author_Institution :
Dept. of Electr. Eng., Chubu Univ., Aichi
Abstract :
Semi-conducting glaze porcelain insulators show better contamination flashover voltages compared with normal porcelain insulators due to surface drying effect by the leakage current flowing in the glaze together with improved voltage distribution even at the dry bands by parallel surface glaze resistance. However, ageing deterioration of semi-conducting glaze is not avoidable. We have conducted accelerated ageing test and outdoor exposure test under the continuous voltage of 160 kV (line to ground for 275 kV system voltage) on various types of semi-conducting glaze insulators. After 1100 cycles of accelerated ageing test and 6 years of outdoor exposure test, we examined the surface deterioration among various types of insulators, such as cap and pin type, long-rod type, station post type and bushing shell, all 275-kV class full scale insulators. The degrees of surface deteriorations are quite different among different types of insulators.
Keywords :
ageing; flashover; glazes; insulator contamination; insulator testing; porcelain insulators; semiconductor devices; ageing test; leakage current; porcelain insulators; semiconducting glaze insulators; surface drying effect; voltage distribution; Accelerated aging; Glazes; Insulation; Insulator testing; Life estimation; Porcelain; Surface contamination; Surface resistance; System testing; Voltage;
Conference_Titel :
Electrical Insulation, 2008. ISEI 2008. Conference Record of the 2008 IEEE International Symposium on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4244-2091-9
Electronic_ISBN :
1089-084X
DOI :
10.1109/ELINSL.2008.4570282