DocumentCode :
2212405
Title :
Numerical simulation techniques for the study of high-power diodes for radiography
Author :
Welch, Dale R. ; Rose, David V. ; Oliver, Bryan V. ; Hughes, T.P. ; Clark, R.E.
Author_Institution :
Mission Res. Corp., Albuquerque, NM, USA
fYear :
2000
fDate :
4-7 June 2000
Firstpage :
281
Abstract :
Summary form only given. In the IPROP and LSP codes, we have developed the capability for multi-dimensional simulation of dense plasmas in pulsed-power devices. The plasma modeling includes an implicit electromagnetic field solver that permits large time steps and fine resolution of plasma in one direction and coarse resolution in the other directions. The new solver is well suited to the simulations of thin surface and dense bulk plasmas. These codes use a hybrid (fluid/kinetic) description of the plasma electrons and kinetic modeling of ions. This description permits the simulation of a high-density plasma without micro time steps and zoning. In order to determine the rate at which contaminants leave the surface, we also model the electron interaction with the anode. The interaction is presently modeled utilizing Moliere multiple scattering and an energy-loss model for treating the interaction of high-energy electrons with the anode. A new model utilizing the ITS series of Monte Carlo algorithms is being implemented to more accurately simulate energy loss, scattering and production of secondary electrons. A detailed description of these models and some relevant examples will be discussed.
Keywords :
Monte Carlo methods; X-ray production; bremsstrahlung; digital simulation; plasma diodes; power supplies to apparatus; radiography; IPROP code; ITS series; LSP code; Moliere multiple scattering; Monte Carlo algorithms; coarse resolution; contaminants; dense bulk plasmas; dense plasmas; electron-anode interaction; energy-loss model; fine resolution; high-density plasma; high-energy electrons; high-power diodes; hybrid fluid-kinetic description; implicit electromagnetic field solver; kinetic modeling; multi-dimensional simulation; numerical simulation techniques; plasma electrons; pulsed-power devices; radiography; secondary electrons; thin surface plasmas; time steps; Anodes; Diodes; Electromagnetic scattering; Electrons; Kinetic theory; Numerical simulation; Plasma density; Plasma devices; Plasma simulation; Surface contamination;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-5982-8
Type :
conf
DOI :
10.1109/PLASMA.2000.855161
Filename :
855161
Link To Document :
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