Title :
1.55 /spl mu/m surface excited monolithically integrated balanced metal-semiconductor-metal photodetectors and coplanar waveguide
Author :
Safwat, A.M.E. ; Junghwan Kim ; Johnson, Wayne ; Walker, B. ; Lee, C.H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Maryland Univ., College Park, MD, USA
Abstract :
Two metal-semiconductor-metal (MSM) photodetectors are integrated monolithically with coplanar waveguide transmission line. By illuminating this structure with CW light and taking the difference between the two detectors, 9-10 dB noise cancellation was achieved. Another demonstration of noise cancellation is then proposed. Measurements show that the noise can be reduced by 3 dB without degrading the signal to noise ratio.
Keywords :
coplanar transmission lines; coplanar waveguides; integrated optoelectronics; interference suppression; microwave photonics; optical receivers; photodetectors; 1.55 micron; CW light illumination; MSM photodetectors; coplanar waveguide transmission line; metal-semiconductor-metal photodetectors; monolithically integrated balanced MSM photodetectors/coplanar waveguide; noise cancellation; signal to noise ratio; surface excited balanced MSM photodetectors/coplanar waveguide; Coplanar transmission lines; Coplanar waveguides; Degradation; Noise cancellation; Noise measurement; Noise reduction; Photodetectors; Signal to noise ratio; Surface waves; Transmission line measurements;
Conference_Titel :
Microwave Photonics, 2001. MWP '01. 2001 International Topical Meeting on
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
0-7803-7003-1
DOI :
10.1109/MWP.2002.981818
