• DocumentCode
    2212707
  • Title

    Reflected electron distribution on anode surface of vacuum gap during electron beam bombardment: experimental results

  • Author

    Shostak, Volodymyr ; Yagodzinskyj, Vyacheslav

  • Author_Institution
    Lab. of High Voltage Eng. & Electrophys., Kyiv Polytech. Inst., Ukraine
  • Volume
    2
  • fYear
    1996
  • fDate
    21-26 Jul 1996
  • Firstpage
    799
  • Abstract
    Previously carried out analysis and simulation (see V.A. Shostak, 15th International Symposium on Discharges and Electrical Insulation, Darmstadt, Germany, p.726-9, 1992) of the reflection of an electron beam bombarding the anode through the hole in a cathode in vacuum gap (VG) with parallel electrodes and constant electrical field showed, that electrons distributions on anode surface have some peculiarities, in particular the availability of additional maximums and gradients, and dependence of their location and value on ratio of total beam energy and energy acquired by beam at VG. In this paper the results of experimental investigation of these distributions are presented (beam energy-15 keV, gap-40 mm, VG voltage-from 5 to 30 kV). In general, obtained results confirm qualitatively the peculiarities predicted by simulation
  • Keywords
    anodes; cathodes; current distribution; electron beams; electron emission; vacuum breakdown; 15 keV; 40 mm; 5 to 30 kV; anode surface; beam energy; cathode hole; constant electrical field; electron beam bombardment; electrons distributions; parallel electrodes; reflected electron distribution; total beam energy; vacuum gap; Analytical models; Anodes; Cathodes; Charge carrier processes; Dielectrics and electrical insulation; Electrodes; Electron beams; Elementary particle vacuum; Optical reflection; Surface discharges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    0-7803-2906-6
  • Type

    conf

  • DOI
    10.1109/DEIV.1996.545473
  • Filename
    545473