• DocumentCode
    2212814
  • Title

    Reliability Factors

  • Author

    Frary, J.M.

  • Author_Institution
    Storage Technology Corporation
  • fYear
    1993
  • fDate
    24-27 Oct 1993
  • Firstpage
    144
  • Lastpage
    151
  • Keywords
    Buildings; Costs; Degradation; Fault tolerance; Integrated circuit reliability; Manufacturing processes; Material storage; Protection; Q factor; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 1993 International
  • Type

    conf

  • DOI
    10.1109/IRWS.1993.666302
  • Filename
    666302