DocumentCode :
2213054
Title :
Thermal stability of perpendicular exchange bias in [Pd/Ferromagnet]N/FeMn films
Author :
Joo, H.W. ; Heo, J. ; Choi, H.C. ; Kim, M.S. ; Choi, S.D. ; You, C.-Y. ; Lee, K.A. ; Lee, S.S. ; Hwang, D.G.
Author_Institution :
Univ. of Inha, Incheon
Volume :
1
fYear :
2006
fDate :
22-25 Oct. 2006
Firstpage :
386
Lastpage :
387
Abstract :
The dependencies of the annealing temperature and the stack number ,N on perpendicular exchange-biasing(Hex) and coercivity(Hc) in |Pd/Co|N and |Pd/Co (or CoFe)lN/FeMn multilayers were investigated. The surface anisotropy was varied as a function of N with constant bulk anisotropy. It was found that Hex does not depend on the surface anisotropy, while Hc shows a strong dependence. Therefore, it is possible to tailor wide ranges of the Hc (300 ~ 600 Oe) without varying Hex(250 ~ 300 Oe) through the single control parameter stack number N. After annealing the Hc shows peak value at 350degC in |Pd/Co] multilayers without FeMn, but the peak temperature is down to 250degC for the exchange biased |Pd/F]N/FeMn samples.
Keywords :
cobalt alloys; coercive force; ferromagnetic materials; iron alloys; magnetic annealing; magnetic multilayers; magnetic thin films; palladium alloys; perpendicular magnetic anisotropy; thermal stability; CoFe; CoFe - Interface; FeMn; FeMn - Interface; Pd-Co; Pd-Co - Interface; Pd/Co multilayers; [Pd/ferromagnet]N/FeMn films; annealing temperature; coercivity; magnetic multilayers; perpendicular exchange bias; surface anisotropy; temperature 350 C; thermal stability; Anisotropic magnetoresistance; Annealing; Coercive force; Magnetic anisotropy; Magnetic multilayers; Perpendicular magnetic recording; Physics; Saturation magnetization; Temperature dependence; Thermal stability; Pd/Co multilayer; coercivity; exchange bias; perpendicular magnetic anisotropy; temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE
Conference_Location :
Gyeongju
Print_ISBN :
978-1-4244-0541-1
Electronic_ISBN :
978-1-4244-0541-1
Type :
conf
DOI :
10.1109/NMDC.2006.4388779
Filename :
4388779
Link To Document :
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