• DocumentCode
    2213606
  • Title

    Characterization and properties of a textured silicon surface with nano-porous layer

  • Author

    Lee, Eunjoo ; Lee, Soohong

  • Author_Institution
    Sejong Univ., Seoul
  • Volume
    1
  • fYear
    2006
  • fDate
    22-25 Oct. 2006
  • Firstpage
    430
  • Lastpage
    431
  • Abstract
    The nano-structural anti-reflection layers were investigated. Nano-porous layer was formed on Si substrates by electrochemical etching in HF-based electrolyte. Porous Si layer on the front surface of n+/p monocrystalline, textured Si substrate have been investigated with the aim of improving the performance of silicon solar cells, because an antireflection coating and a surface passivation can be obtained simultaneously in one process. The nanostructure of porous Si is well aligned with the underlying crystalline Si lattice. The formation of a porous Si layer about 100 nm thick on the textured silicon wafer result in an reflectance lower than 5% in the wavelength region from 500 to 900 nm. Such a surface modification allows improving the Si solar cell characteristics.
  • Keywords
    antireflection coatings; etching; nanoporous materials; passivation; silicon; solar cells; Si; Si - Element; antireflection coating; electrochemical etching; nanoporous layer; nanostructural anti-reflection layers; solar cells; surface modification; surface passivation; textured silicon surface; Coatings; Crystallization; Etching; Optical films; Optical surface waves; Passivation; Photovoltaic cells; Reflectivity; Silicon; Surface texture; Anti-reflection coating; Nano-porous; Porous silicon; Pyramid; Reflectance; Solar cell;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE
  • Conference_Location
    Gyeongju
  • Print_ISBN
    978-1-4244-0541-1
  • Electronic_ISBN
    978-1-4244-0541-1
  • Type

    conf

  • DOI
    10.1109/NMDC.2006.4388801
  • Filename
    4388801