• DocumentCode
    2213701
  • Title

    Raman studies of Ti1-xFexO2 nano-particles

  • Author

    Van Minh, Nguyen ; Long, Dao Hai ; Khoi, Nguyen The ; Kim, Sung-Jin ; Yang, In-Sang

  • Author_Institution
    Ewha Womans Univ., Seoul
  • Volume
    1
  • fYear
    2006
  • fDate
    22-25 Oct. 2006
  • Firstpage
    434
  • Lastpage
    435
  • Abstract
    Ti1-xFexO2 (x=0.00-0.13) nano-particles were prepared by hydrolysis method and characterized by SEM, , TEM, XRD, and magnetization measurements (VSM). We investigated the effects of Fe doping on the structure of the Ti1-xFexO2 system by Raman scattering studies. SEM, TEM and XRD measurements show that the particle size of the powder is in nano-scale, and that the magnetic Fe impurities substitute for the Ti sites in the anatase TiO2 phase. All the samples with x>0 were found to be superparamagnetic at room temperature. Raman spectra show no iron-oxide peak at around 610 cm-1, strongly supporting that the Fe atoms go into the Ti-site in TiO2 of nano-particles. However, for the ceramic samples, one additional Raman peaks at around 610 cm-1 are observed. This may be related to the clusters or disorders created by mixture of various valence state of Fe ions. This may explain the existence if ferromagnetism in the ceramic Ti1-xFexO2 system, but none in the Ti1-xFexO2 nano-particles.
  • Keywords
    Raman spectra; X-ray diffraction; doping; ferromagnetism; magnetic semiconductors; magnetisation; nanoparticles; particle size; scanning electron microscopy; titanium compounds; transmission electron microscopy; Fe doping effects; Raman scattering studies; SEM; TEM; Ti1-xFexO2 nanoparticles; TiFeO - System; TiO2 - Binary; XRD; anatase TiO2 phase; ceramic Ti1-xFexO2 system; ferromagnetism; hydrolysis method; magnetic Fe impurities; magnetization measurements; particle size; powder; Ceramics; Doping; Iron; Magnetization; Particle measurements; Phase measurement; Powders; Raman scattering; Size measurement; X-ray scattering; Anatase; Raman spectroscopy; diluted magnetic semiconductors; nano-particle;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE
  • Conference_Location
    Gyeongju
  • Print_ISBN
    978-1-4244-0541-1
  • Electronic_ISBN
    978-1-4244-0541-1
  • Type

    conf

  • DOI
    10.1109/NMDC.2006.4388803
  • Filename
    4388803