DocumentCode
2213848
Title
Alternative conducted emission measurements with LISN simulation & CISPR 16 Voltage Probe
Author
Sen, Osman ; Cakir, Soydan ; Acak, Savas ; Cetintas, Mustafa
Author_Institution
Electromagnetic Laboratories, TUBITAK UME, Gebze, Kocaeli, Turkey
fYear
2015
fDate
16-22 Aug. 2015
Firstpage
1243
Lastpage
1247
Abstract
Conducted emission tests are always performed by the use of LISNs in laboratories in accordance with CISPR22, CISPR11 and other similar standards. However, it is not always possible to use LISNs because of some limitations. If the Equipment Under Test (EUT) has large dimensions or high currents, it is not, for most of the time, possible to send it to an EMC laboratory or to use LISNs during the test. As a consequence, usage or development of alternative conducted emission test methods are inevitable in industry. In this paper, we investigated the use of LISN simulations constructed with long ordinary cables, capacitors and resistors instead of actual LISNs. In addition, we also improved the usage of CISPR16 Voltage Probe by combining it with impedance measurements of EUT, supply and used cables.
Keywords
Current measurement; Electromagnetic compatibility; Impedance; Impedance measurement; Integrated circuit modeling; Probes; Voltage measurement; Alternative; Conducted Emission; EMC; In-Situ; Industry; LISN; Mains Impedance; On-Site; Probe; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location
Dresden, Germany
Print_ISBN
978-1-4799-6615-8
Type
conf
DOI
10.1109/ISEMC.2015.7256348
Filename
7256348
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