• DocumentCode
    2213848
  • Title

    Alternative conducted emission measurements with LISN simulation & CISPR 16 Voltage Probe

  • Author

    Sen, Osman ; Cakir, Soydan ; Acak, Savas ; Cetintas, Mustafa

  • Author_Institution
    Electromagnetic Laboratories, TUBITAK UME, Gebze, Kocaeli, Turkey
  • fYear
    2015
  • fDate
    16-22 Aug. 2015
  • Firstpage
    1243
  • Lastpage
    1247
  • Abstract
    Conducted emission tests are always performed by the use of LISNs in laboratories in accordance with CISPR22, CISPR11 and other similar standards. However, it is not always possible to use LISNs because of some limitations. If the Equipment Under Test (EUT) has large dimensions or high currents, it is not, for most of the time, possible to send it to an EMC laboratory or to use LISNs during the test. As a consequence, usage or development of alternative conducted emission test methods are inevitable in industry. In this paper, we investigated the use of LISN simulations constructed with long ordinary cables, capacitors and resistors instead of actual LISNs. In addition, we also improved the usage of CISPR16 Voltage Probe by combining it with impedance measurements of EUT, supply and used cables.
  • Keywords
    Current measurement; Electromagnetic compatibility; Impedance; Impedance measurement; Integrated circuit modeling; Probes; Voltage measurement; Alternative; Conducted Emission; EMC; In-Situ; Industry; LISN; Mains Impedance; On-Site; Probe; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
  • Conference_Location
    Dresden, Germany
  • Print_ISBN
    978-1-4799-6615-8
  • Type

    conf

  • DOI
    10.1109/ISEMC.2015.7256348
  • Filename
    7256348