Title :
Calculation of power-supply-induced jitter at a 3-D IC channel including ESD protection circuits
Author :
Park, Eunkyeong ; Kim, Jingook ; Lee, Jongjoo ; Park, Youngwoo
Author_Institution :
School of ECE, Ulsan National Institute of Science and Technology, South Korea
Abstract :
The step response of a single ended output driver with silicon interposer channel is derived including the parasitics of ESD protection circuits. The probability density functions of the output voltage due to supply voltage fluctuations are also analytically calculated. With changing the frequency of supply voltage fluctuations, the effect of ESD parasitics on the output jitter is calculated and compared.
Keywords :
Electrostatic discharges; Fluctuations; Integrated circuits; Jitter; Parasitic capacitance; Transfer functions; Voltage fluctuations; 3-D IC; Electrostatic discharge (ESD) protection circuit; power supply induced jitter (PSIJ); probability density function (PDF); supply voltage fluctuation; transfer function;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4799-6615-8
DOI :
10.1109/ISEMC.2015.7256360
