• DocumentCode
    2214595
  • Title

    Real-Time Fault Detection and Diagnostics Using FPGA-based Architectures

  • Author

    Naber, Nathan ; Getz, Thomas ; Kim, Yong ; Petrosky, James

  • Author_Institution
    Dept. of Electr. Eng., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
  • fYear
    2010
  • fDate
    Aug. 31 2010-Sept. 2 2010
  • Firstpage
    346
  • Lastpage
    351
  • Abstract
    A new methodology for radiation induced real-time fault detection and diagnosis, utilizing FPGA-based architectures was developed. The methodology includes a full test platform to evaluate a circuit while under radiation and an algorithm to detect and diagnose fault locations within a circuit using Triple Design Triple Modular Redundancy (TDTMR). An analysis of the system was established using a fault injection. Additionally a functional gamma irradiation analysis was performed to assess the effectiveness of the method. The detection and diagnosis algorithm was capable of detecting errors by switching dynamically during the analysis of an FPGA. However, only the injected fault test was able to properly diagnose the location of the fault. The results indicate that FPGA radiation induced fault production is dependent upon radiation dose rate. A fully interchangeable and operational testing platform has been established along with an algorithm that detects and diagnoses errors in real-time.
  • Keywords
    circuit testing; error detection; fault diagnosis; field programmable gate arrays; gamma-rays; heat radiation; redundancy; FPGA based architecture; error detection; fault diagnostics; fault injection; functional gamma irradiation analysis; interchangeable testing; operational testing; radiation dose rate; real time fault detection; triple design triple modular redundancy; Fault Detection; Real-time diagnostics; Single Event Effects; Total Ionizing Dose; Triple Modular Redundancy; gamma radiation; thermal radiation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field Programmable Logic and Applications (FPL), 2010 International Conference on
  • Conference_Location
    Milano
  • ISSN
    1946-1488
  • Print_ISBN
    978-1-4244-7842-2
  • Type

    conf

  • DOI
    10.1109/FPL.2010.75
  • Filename
    5694274