Materials characterization using a structure based on microstrip line

The considerable evolution of microelectronics has highlighted the need for new dielectric materials of high permittivity (high-k). Because of their high permittivity, these materials can also be very good candidates for other microwave applications, especially if their dielectric losses are low. A new application of miniature antennas performed on these high-k materials and designed a new concept of interconnections without son. Proper use of these materials requires a knowledge of their dielectric properties. To do so, a rigorous characterization of these materials has been established, and we used to characterize our materials. We present in this section a technique for extracting the permittivity and permeability of high-k materials from measurements of planar transmission lines.