Title :
Interconnect testing in cluster-based FPGA architectures
Author :
Harris, Ian G. ; Tessier, Russell
Author_Institution :
University of Massachusefts
Keywords :
Application specific integrated circuits; Circuit faults; Circuit testing; Computer aided manufacturing; Computer architecture; Costs; Fault detection; Field programmable gate arrays; Hardware; Logic;
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
DOI :
10.1109/DAC.2000.855275
