DocumentCode
2214756
Title
Interconnect testing in cluster-based FPGA architectures
Author
Harris, Ian G. ; Tessier, Russell
Author_Institution
University of Massachusefts
fYear
2000
fDate
2000
Firstpage
49
Lastpage
54
Keywords
Application specific integrated circuits; Circuit faults; Circuit testing; Computer aided manufacturing; Computer architecture; Costs; Fault detection; Field programmable gate arrays; Hardware; Logic;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN
1-58113-187-9
Type
conf
DOI
10.1109/DAC.2000.855275
Filename
855275
Link To Document