DocumentCode
2214793
Title
Ellipsometry for Measurement of Complex Dielectric Permittivity in Millimeter-Wave Region
Author
Tsuzukiyama, Koji ; Sakai, Taiji ; Yamazaki, Takaaki ; Hashimoto, Osamu
Author_Institution
Mitsui Chemicals, INC., 580-32 Nagaura, Sodegaura Chiba, 299-0265 Japan, Tel:+81-438-64-2327, E-mail: Koji.Tsuzukiyama@mitsui-chem.co.jp
fYear
2003
fDate
Oct. 2003
Firstpage
487
Lastpage
490
Abstract
The ellipsometry method is extended to a measurement for complex permittivities of materials in millimeter-wave region. We propose an effective technique based on the Fourier analysis method to eliminate an uncertainty due to the free-space method. Complex permittivities can be measured with a high degree of accuracy by the improved ellipsometry method, as named Fourier Analysis Correction Ellipsometry (FACE) Method.
Keywords
Antenna measurements; Detectors; Dielectric measurements; Electromagnetic measurements; Electromagnetic wave polarization; Ellipsometry; Frequency; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2003 33rd European
Conference_Location
Munich, Germany
Print_ISBN
1-58053-834-7
Type
conf
DOI
10.1109/EUMA.2003.340996
Filename
4143060
Link To Document