DocumentCode :
2215068
Title :
Analysis of thermal conductivity in Ni-doped CoSb3
Author :
Kitagawa, Hiroyuki ; Wakatsuki, Machiko ; Isoda, Yukihiro ; Shinohara, Yoshikazu ; Hasezaki, Kazuhiro ; Noda, Yasutoshi
Author_Institution :
Dept. of Mater. Sci., Shimane Univ., Matsue, Japan
fYear :
2005
fDate :
19-23 June 2005
Firstpage :
449
Lastpage :
452
Abstract :
Co1-xNixSb3 (x = 0.005≈0.1) samples were prepared by direct melting of constituent elements in a graphite crucible and subsequently was sintered using spark plasma sintering. The temperature dependence of the Hall coefficient, Hall mobility, Seebeck coefficient, electrical resistivity and thermal conductivity were investigated in a temperature range from 20 to 773 K. All the measured samples are n-type semiconductor and the conduction type changes from n- to p-type at around 450 K. The temperature for the transition from n-type to p-type increased with increasing Ni content x. The scattering factor, Fermi energy and Lorenz number were estimated and thermal conductivity was analyzed as a function of temperature. The lattice component of thermal conductivity is dominant at low temperatures but carrier and bipolar components become large at temperatures higher than the transition temperature.
Keywords :
Fermi level; Hall mobility; Seebeck effect; antimony alloys; cobalt alloys; electrical resistivity; melt processing; nickel; semiconductor materials; sintering; thermal conductivity; 20 to 773 K; Co1-xNixSb3; Fermi energy; Hall coefficient; Hall mobility; Lorenz number; Seebeck coefficient; direct melting; electrical resistivity; n-type semiconductor; p-type semiconductor; scattering factor; spark plasma sintering; thermal conductivity; Conductivity measurement; Electric resistance; Hall effect; Plasma measurements; Plasma temperature; Sparks; Temperature dependence; Temperature distribution; Thermal conductivity; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 2005. ICT 2005. 24th International Conference on
ISSN :
1094-2734
Print_ISBN :
0-7803-9552-2
Type :
conf
DOI :
10.1109/ICT.2005.1519983
Filename :
1519983
Link To Document :
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