Title :
An investigation on the robustness, accuracy and simulation performance of a physics-based deep-submicronmeter BSIM model for analog/digital circuit simulation
Author :
Cheng, Yuhua ; Jeng, Min-Chie ; Liu, Zhihong ; Chen, Kai ; Chan, Mansun ; Hu, Chenming ; Ping Keung Kox
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
We present an accurate and unified MOSFET model with benchmark test results for analog/digital circuit simulation. The results show that the model can pass most benchmarks suggested for a model used in circuit simulation by SEMATECH recently, and ensures good scalability and accuracy. The model has been implemented in HSpice, Spectre, SmartSpice and Spice3e2
Keywords :
MOS integrated circuits; MOSFET; SPICE; circuit analysis computing; digital simulation; integrated circuit modelling; mixed analogue-digital integrated circuits; HSpice; SmartSpice; Spectre; Spice3e2; analog/digital circuit simulation; benchmark test results; physics-based deep-submicronmeter BSIM model; robustness; scalability; simulation performance; unified MOSFET model; Benchmark testing; Circuit simulation; Circuit testing; Computational efficiency; Computational modeling; MOSFET circuits; Robustness; Scalability; Solid modeling; Threshold voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-3117-6
DOI :
10.1109/CICC.1996.510567
