An investigation on the robustness, accuracy and simulation performance of a physics-based deep-submicronmeter BSIM model for analog/digital circuit simulation

Author

Cheng, Yuhua ; Jeng, Min-Chie ; Liu, Zhihong ; Chen, Kai ; Chan, Mansun ; Hu, Chenming ; Ping Keung Kox

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA

fYear

1996

fDate

5-8 May 1996

Firstpage

321

Lastpage

324

Abstract

We present an accurate and unified MOSFET model with benchmark test results for analog/digital circuit simulation. The results show that the model can pass most benchmarks suggested for a model used in circuit simulation by SEMATECH recently, and ensures good scalability and accuracy. The model has been implemented in HSpice, Spectre, SmartSpice and Spice3e2

Keywords

MOS integrated circuits; MOSFET; SPICE; circuit analysis computing; digital simulation; integrated circuit modelling; mixed analogue-digital integrated circuits; HSpice; SmartSpice; Spectre; Spice3e2; analog/digital circuit simulation; benchmark test results; physics-based deep-submicronmeter BSIM model; robustness; scalability; simulation performance; unified MOSFET model; Benchmark testing; Circuit simulation; Circuit testing; Computational efficiency; Computational modeling; MOSFET circuits; Robustness; Scalability; Solid modeling; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996

Conference_Location

San Diego, CA

Print_ISBN

0-7803-3117-6

Type

conf

DOI

10.1109/CICC.1996.510567

Filename

510567