Title :
CMOS technology characterization for analog and RF design
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
Characterization of CMOS technologies for digital applications often proves inadequate for analog and RF design. This paper describes a set of characterization vehicles and tests that quantify the analog behavior of active and passive devices in CMOS processes, in particular, properties that are not represented accurately in SPICE models. Test structures and circuits are introduced for measuring speed, noise, linearity, loss, matching, and dc characteristics
Keywords :
CMOS analogue integrated circuits; SPICE; integrated circuit design; integrated circuit measurement; integrated circuit modelling; integrated circuit testing; CMOS technology characterization; RF design; SPICE models; active devices; analog design; characterization vehicles; linearity; passive devices; test structures; CMOS process; CMOS technology; Circuit testing; Loss measurement; Noise measurement; Radio frequency; SPICE; Semiconductor device modeling; Vehicles; Velocity measurement;
Conference_Titel :
Custom Integrated Circuits Conference, 1998. Proceedings of the IEEE 1998
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-4292-5
DOI :
10.1109/CICC.1998.694900
