Title :
EM Analysis of Shielding Strategies to reduce Substrate Noise in Silicon based Technology
Author :
Bajon, D. ; Wane, S. ; Baudrand, H. ; Gamand, P.
Author_Institution :
SUPAERO 10 av. Ed. Belin, 31055 Toulouse-France
Abstract :
EM Fullwave Analysis intend to become an alternative to the required wide experimental investigations on Substrate Noise Reduction Techniques. From a dedicated home-made full-wave simulator, a comprehensive analysis of Guard Ring and shielding techniques is developed in view to enhance their specific efficiency ; intensive field and current distributions support the analysis and isolation capabilities are discussed.
Keywords :
Analytical models; Circuit noise; Circuit simulation; Frequency; Impedance; Noise reduction; Protection; Semiconductor device noise; Silicon; Substrates;
Conference_Titel :
Microwave Conference, 2003 33rd European
Conference_Location :
Munich, Germany
Print_ISBN :
1-58053-834-7
DOI :
10.1109/EUMA.2003.341036
