• DocumentCode
    2215673
  • Title

    Static noise analysis for digital integrated circuits in partially-depleted silicon-on-insulator technology

  • Author

    Shepard, Kenneth L. ; Kim, Dae-Jin

  • Author_Institution
    Columbia University
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    239
  • Lastpage
    242
  • Keywords
    Circuit noise; Digital integrated circuits; Insulation; Integrated circuit noise; Integrated circuit technology; Leakage current; Permission; Physics; Silicon on insulator technology; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2000. Proceedings 2000
  • Print_ISBN
    1-58113-187-9
  • Type

    conf

  • DOI
    10.1109/DAC.2000.855310
  • Filename
    855310
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2215673