Title :
Parasitic characterization of radio-frequency (RF) circuits using mixed-mode simulation
Author :
Jaejune Jang ; Kan, Edwin C. ; So, L. ; Dutton, R.W.
Author_Institution :
Integrated Circuits Lab., Stanford Univ., CA
Abstract :
Accurate estimation of the parasitics in high-speed circuits is critical in optimizing circuit performance. A new method for parasitic characterization of highspeed circuits employing mixed-mode circuit and device simulation is proposed. The intrinsic characteristics are captured using a device simulator and the equivalent circuit for passive extrinsic elements are evaluated in a straight forward manner from impedance and admittance representation of measured S-parameters. This decoupling enables total performance optimization based on separate tuning of layout and the fabrication process recipe
Keywords :
MMIC; S-parameters; UHF integrated circuits; circuit analysis computing; equivalent circuits; integrated circuit modelling; semiconductor device models; MMIC; RF circuits; S-parameters; UHF IC; admittance representation; circuit/device simulation; equivalent circuit; high-speed circuits; impedance representation; mixed-mode simulation; parasitic characterization; passive extrinsic elements; radiofrequency circuits; total performance optimization; Circuit optimization; Circuit simulation; Computational modeling; Equivalent circuits; Integrated circuit interconnections; Performance analysis; RLC circuits; Radio frequency; Scattering parameters; Semiconductor process modeling;
Conference_Titel :
Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-3117-6
DOI :
10.1109/CICC.1996.510593
