• DocumentCode
    2215824
  • Title

    Classifying the bugs using multi-class semi supervised support vector machine

  • Author

    Nigam, Abhishek ; Nigam, B. ; Bhaisare, C. ; Arya, N.

  • Author_Institution
    Ideavate Solutions, Indore, India
  • fYear
    2012
  • fDate
    21-23 March 2012
  • Firstpage
    393
  • Lastpage
    397
  • Abstract
    It is always important in the Software Industry to know about what types of bugs are getting reported into the applications developed or maintained by them. Categorizing bugs based on their characteristics helps Software Development team to take appropriate actions in order to reduce similar defects that might get reported in future releases. Defects or Bugs can be classified into many classes, for which a training set is required, known as the Class Label Data Set. If Classification is performed manually then it will consume more time and efforts. Also, human resource having expert testing skills & domain knowledge will be required for labelling the data. Therefore Semi Supervised Techniques are been used to reduce the work of labelling dataset, which takes some labeled with unlabeled dataset to train the classifier. In this paper Self Training Algorithm is used for Semi Supervised Learning and Winner-Takes-All strategy is applied to perform Multi Class Classification. This model provides Classification accuracy up to 93%.
  • Keywords
    DP industry; learning (artificial intelligence); pattern classification; program debugging; software maintenance; support vector machines; bug classification; class label data set; defect classification; multiclass semi supervised support vector machine; self training algorithm; semi supervised learning; software development team; software industry; training set; winner-takes-all strategy; Accuracy; Classification algorithms; Computer bugs; Kernel; Support vector machines; Testing; Training; Bugs; Multi-Class Classification; Self Training; Semi Supervised Learning; Support Vector Machine (SVM);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, Informatics and Medical Engineering (PRIME), 2012 International Conference on
  • Conference_Location
    Salem, Tamilnadu
  • Print_ISBN
    978-1-4673-1037-6
  • Type

    conf

  • DOI
    10.1109/ICPRIME.2012.6208378
  • Filename
    6208378