DocumentCode :
2215978
Title :
An integrity measurement model for embedded system-based trusted computing platform
Author :
Xi, Qin ; Chaowen, Chang
Author_Institution :
Inst. of Electron. & Technol., Inf. Eng. Univ., Zhengzhou, China
Volume :
1
fYear :
2010
fDate :
20-22 Aug. 2010
Abstract :
Integrity measurement is an important attribute in trusted computing. An integrity measurement model for computing platform is proposed, which aims at providing effective measurement and security protection for the booting of the platform, the loading of the process and the running of the procedure. The trusted platform which is based on embedded system and virtual machine can tolerate untrusted components and needn´t change hardware structure and operating system on the legacy terminal system. On the transferring process of trusted chain of the platform, the shift of control right depends on the results of integrity measurement for every level of the platform. Considering the complexity and variety of every level, different measurement methods are provided for different levels to measure the integrity of components.
Keywords :
data integrity; embedded systems; security of data; virtual machines; embedded system-based trusted computing platform; integrity measurement model; legacy terminal system; operating system; security protection; virtual machine; Computational modeling; Cryptography; Hardware; Load modeling; LSM; TPM; embedded system; integrity measurement; trusted computing platform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Computer Theory and Engineering (ICACTE), 2010 3rd International Conference on
Conference_Location :
Chengdu
ISSN :
2154-7491
Print_ISBN :
978-1-4244-6539-2
Type :
conf
DOI :
10.1109/ICACTE.2010.5579037
Filename :
5579037
Link To Document :
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