DocumentCode
2216168
Title
Wafer-Level Transmission Line Pulse Testing for Optimization of Output Transistor ESD Resistance
Author
Miller, James W. ; Dickson, Nicholas ; Rushing, Tom
Author_Institution
Motorola
fYear
1993
fDate
24-27 Oct 1993
Firstpage
208
Lastpage
214
Keywords
Diodes; Electric breakdown; Electrostatic discharge; Failure analysis; Impedance; Power transmission lines; Pulse generation; Silicon; Testing; Transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report, 1993 International
Type
conf
DOI
10.1109/IRWS.1993.666316
Filename
666316
Link To Document