DocumentCode :
2216168
Title :
Wafer-Level Transmission Line Pulse Testing for Optimization of Output Transistor ESD Resistance
Author :
Miller, James W. ; Dickson, Nicholas ; Rushing, Tom
Author_Institution :
Motorola
fYear :
1993
fDate :
24-27 Oct 1993
Firstpage :
208
Lastpage :
214
Keywords :
Diodes; Electric breakdown; Electrostatic discharge; Failure analysis; Impedance; Power transmission lines; Pulse generation; Silicon; Testing; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 1993 International
Type :
conf
DOI :
10.1109/IRWS.1993.666316
Filename :
666316
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2216168
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