Dielectric Parameters Study Using a Waveguide Cavity and a Rigorous Processing Algorithm

The measurements of permittivity of various dielectrics is one of "long time keeping attention problem" [1,2,4]. The millimeter-wave vector network analyzer and algorithm, comprising the semi-analytical rigorous solution of direct and numerical solution of inverse problem are developed [2,4]. The waveguide chamber with dielectric placed inside is considered as a principal element of the experimental set. The abilities and capacity of measuring devise supplied with processing algorithms are described in the presentation.