• DocumentCode
    2216424
  • Title

    Attenuated total reflection and surface plasmon emission light properties of molecular aligned naphthacene thin films

  • Author

    Kato, Keizo ; Shimaoka, Tohru ; Yamashita, Kazuki ; Ohdaira, Yasuo ; Shinbo, Kazunari ; Kaneko, Futao

  • Volume
    1
  • fYear
    2006
  • fDate
    22-25 Oct. 2006
  • Firstpage
    592
  • Lastpage
    593
  • Abstract
    Molecular aligned naphthacene thin films were prepared using rubbing method. The attenuated total reflection (ATR) and surface plasmon (SP) emission light properties were investigated. The long axis of the naphthacene molecule was found to be aligned perpendicular to the rubbing direction. The ATR and SP emission light properties depended on the molecular orientation.
  • Keywords
    dielectric thin films; dyes; light reflection; luminescence; molecular orientation; surface plasmons; attenuated total reflection; molecular aligned naphthacene thin films; molecular orientation; rubbing method; surface plasmon emission light properties; Absorption; Free electron lasers; Optical films; Optical polarization; Optical reflection; Optical surface waves; Plasmons; Stimulated emission; Transistors; Wavelength measurement; molecular orientation attenuated total reflection; naphthacene; surface plasmon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE
  • Conference_Location
    Gyeongju
  • Print_ISBN
    978-1-4244-0541-1
  • Electronic_ISBN
    978-1-4244-0541-1
  • Type

    conf

  • DOI
    10.1109/NMDC.2006.4388918
  • Filename
    4388918