Title :
Attenuated total reflection and surface plasmon emission light properties of molecular aligned naphthacene thin films
Author :
Kato, Keizo ; Shimaoka, Tohru ; Yamashita, Kazuki ; Ohdaira, Yasuo ; Shinbo, Kazunari ; Kaneko, Futao
Abstract :
Molecular aligned naphthacene thin films were prepared using rubbing method. The attenuated total reflection (ATR) and surface plasmon (SP) emission light properties were investigated. The long axis of the naphthacene molecule was found to be aligned perpendicular to the rubbing direction. The ATR and SP emission light properties depended on the molecular orientation.
Keywords :
dielectric thin films; dyes; light reflection; luminescence; molecular orientation; surface plasmons; attenuated total reflection; molecular aligned naphthacene thin films; molecular orientation; rubbing method; surface plasmon emission light properties; Absorption; Free electron lasers; Optical films; Optical polarization; Optical reflection; Optical surface waves; Plasmons; Stimulated emission; Transistors; Wavelength measurement; molecular orientation attenuated total reflection; naphthacene; surface plasmon;
Conference_Titel :
Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE
Conference_Location :
Gyeongju
Print_ISBN :
978-1-4244-0541-1
Electronic_ISBN :
978-1-4244-0541-1
DOI :
10.1109/NMDC.2006.4388918
