DocumentCode
2216677
Title
Access-chip Early Reliability Estimation
Author
Moran, Dave E.
Author_Institution
IBM Microelectronics Division
fYear
1993
fDate
24-27 Oct 1993
Firstpage
218
Lastpage
219
Keywords
Application software; Circuits; Degradation; Delay estimation; Electromigration; Hot carriers; Life estimation; Lifetime estimation; Logic arrays; Microprocessors;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report, 1993 International
Type
conf
DOI
10.1109/IRWS.1993.666318
Filename
666318
Link To Document