Title :
Self-test methodology for at-speed test of crosstalk in chip interconnects
Author :
Bai, Xiaoliang ; Dey, Sujit ; Rajski, Janusz
Author_Institution :
University of California
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Crosstalk; Delay; Detectors; Fault detection; Integrated circuit interconnections; System testing; System-on-a-chip;
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
DOI :
10.1109/DAC.2000.855387
